发明名称 Electron beam sensor
摘要 A sensing device for sensing an electron beam includes a vacuum chamber having an electron permeable window for allowing electrons from the electron beam to enter vacuum chamber. An electrode extends within the vacuum chamber for receiving at least a portion of the electrons entering the vacuum chamber. The intensity of the electron beam is capable of being determined from the amount of electrons received by the electrode.
申请公布号 US2004119024(A1) 申请公布日期 2004.06.24
申请号 US20020326923 申请日期 2002.12.19
申请人 ADVANCED ELECTRON BEAMS, INC. 发明人 AVNERY TZVI
分类号 H01J37/244;(IPC1-7):H01J37/244 主分类号 H01J37/244
代理机构 代理人
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