发明名称 |
MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a manufacturing method of a semiconductor device which performs non-selective etching or selective etching for a plurality of insulating films on a semiconductor substrate by using etchant of the same composition which uses neither organic acid nor organic solvent. SOLUTION: Etchant is water solution of HF which dissociates to F<SP>-</SP>and HF<SB>2</SB><SP>-</SP>in water solution. Setting of whether selectivity (etching rate) of an SiN film to a thermal oxide SiO<SB>2</SB>film is about 1 or a large value of about 30 or more is changed by controlling concentration and temperature of the HF water solution, and the water solution is used both in non-selective etching process and selective etching process of the SiN film to the thermal oxide SiO<SB>2</SB>film. COPYRIGHT: (C)2004,JPO
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申请公布号 |
JP2004179583(A) |
申请公布日期 |
2004.06.24 |
申请号 |
JP20020346928 |
申请日期 |
2002.11.29 |
申请人 |
TOSHIBA CORP |
发明人 |
SAITO MASAMI;SATO MOTOYUKI;OGUCHI HISASHI;OGAWA YOSHIHIRO;TOMITA HIROSHI;KAWAMOTO HIROSHI |
分类号 |
H01L21/768;H01L21/308;H01L23/522;(IPC1-7):H01L21/308 |
主分类号 |
H01L21/768 |
代理机构 |
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