发明名称 METHOD FOR FABRICATING METAL SILICIDE
摘要 A method for fabricating a metal silicide layer includes forming a dielectric layer on a substrate, followed by forming a polysilicon material conductive layer on the dielectric layer. An adhesion layer is then formed on the conductive layer, wherein the adhesion layer is a nitrogen rich layer or a nitrogen ion implanted layer. A metal silicide layer is then formed on the adhesion layer. The adhesion between the metal silicide layer and the conductive layer is more desirable due the adhesion layer.
申请公布号 US2004121592(A1) 申请公布日期 2004.06.24
申请号 US20020248177 申请日期 2002.12.24
申请人 CHANG KENT KUOHUA 发明人 CHANG KENT KUOHUA
分类号 H01L21/28;H01L21/768;H01L29/49;(IPC1-7):H01L21/44;C23C16/00;H01L21/320;H01L21/476 主分类号 H01L21/28
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