发明名称 |
Semiconductor device having a multilayer interconnection structure and fabrication process thereof |
摘要 |
A multilayer interconnection structure includes a first interconnection layer (21Cu) having a copper interconnection pattern and a second interconnection layer having an aluminum interconnection layer (23) and formed on the first interconnection layer via an intervening interlayer insulation film (22), wherein a tungsten plug (22W) is formed in a via-hole (22V) formed in the interlayer insulation film so as to connect the first interconnection layer and the second interconnection layer electrically. The via-hole has a depth/diameter ratio of 1.25 or more, and there is formed a conductive nitride film (22A) between the outer wall of the tungsten plug and an inner wall of the via-hole such that the entirety of the conductive nitride film is formed of a conductive nitride. |
申请公布号 |
EP1432025(A2) |
申请公布日期 |
2004.06.23 |
申请号 |
EP20030029486 |
申请日期 |
2003.12.19 |
申请人 |
FUJITSU LIMITED |
发明人 |
TAKAYAMA, TOSHIO;NARUKAWA, KUNIYUKI;MIZUTANI, HIROSHI |
分类号 |
H01L21/28;H01L21/285;H01L21/3205;H01L21/768;H01L23/52;H01L23/522;H01L23/532;(IPC1-7):H01L21/768 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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