发明名称 |
Method and Device for Resistance Measurement of a Temperature Dependent Resistor |
摘要 |
An temperature sensitive resistance (R) impedance measurement procedure uses a four contact (L1-4) technique with microprocessor controlled multiplexing (MUX) but switches (S2) to three contact technique if a conductor breaks and to two contact technique if a second conductor break occurs. Includes Independent claims for equipment using the procedure.
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申请公布号 |
EP1431768(A1) |
申请公布日期 |
2004.06.23 |
申请号 |
EP20030027162 |
申请日期 |
2003.11.27 |
申请人 |
ENDRESS + HAUSER WETZER GMBH + CO. KG |
发明人 |
KONRAD, STEPHAN |
分类号 |
G01R27/08;(IPC1-7):G01R27/02 |
主分类号 |
G01R27/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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