发明名称 Method of forming the silicon germanium base of a bipolar transistor
摘要 The intrinsic base region of a bipolar transistor is formed to avoid a chemical interaction between the chemicals used in a chemical mechanical polishing step and the materials used to form the base region. The method includes the step of forming a trench in a layer of epitaxial material. After this, a base material that includes silicon and germanium is blanket deposited, followed by the blanket deposition of a layer of protective material. The layer of protective material protects the base material from the chemical mechanical polishing step.
申请公布号 US6753234(B1) 申请公布日期 2004.06.22
申请号 US20010994293 申请日期 2001.11.26
申请人 NATIONAL SEMICONDUCTOR CORPORATION 发明人 NAEM ABDALLA ALY
分类号 H01L21/331;H01L29/08;H01L29/737;(IPC1-7):H01L21/331 主分类号 H01L21/331
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