| 摘要 |
An inexpensive RF test probe provides consistent monitoring of an RF signal while having minimal effect on the circuit under test. In one embodiment, an RF test probe comprises a return conductor and a probing conductor. The probing conductor is positioned within an insulator and a termination such as a 50 ohm resistor is electrically positioned between the ground conductor and probing conductor. The probe is used by placing a portion of the insulating material surrounding the probe conductor in contact with a circuit such as an RF microstrip carrying an RF signal to be monitored.
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