发明名称 CAPACITOR OF SEMICONDUCTOR DEVICE AND FABRICATING METHOD THEREOF
摘要 PURPOSE: A capacitor of a semiconductor device is provided to guarantee capacitance of a capacitor by preventing a storage node from falling or slanting and by increasing the height of the storage node. CONSTITUTION: An etch stop layer(26), the first mod insulation layer, a storage node supporting layer and the second mold insulation layer are sequentially formed on an insulation layer with a contact. A pattern for forming the storage node(34) is formed on the resultant structure. A photolithography process is performed on the second mold insulation layer, the storage node supporting layer, the first mold insulation layer and the etch stop layer by using the pattern as a mask to form a storage node hole. The storage node hole is filled with a conductive material to form the storage node. The first mold insulation layer on the resultant structure is removed. A photolithography process is performed on the storage node supporting layer exposed by the removal of the first mold insulation layer to form a storage node supporting unit(30a) for supporting a predetermined position of the storage node. The first mold insulation layer formed under the storage node supporting unit is eliminated.
申请公布号 KR20040051667(A) 申请公布日期 2004.06.19
申请号 KR20020078616 申请日期 2002.12.11
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 BAN, HYO DONG;LEE, HO UK
分类号 H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/108
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