发明名称 |
METHOD FOR PRODUCING SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE, AND LASER IRRADIATION APPARATUS |
摘要 |
PROBLEM TO BE SOLVED: To provide a laser irradiation apparatus that restrains unevenness in a surface condition or crystallinity of a semiconductor film in order to crystallize the semiconductor film uniformly; in addition, a production method of the semiconductor device using the laser irradiation apparatus, which restrains on-current of TFT, mobility, and scattering of a threshold value; and a semiconductor device produced using the production method. SOLUTION: In a production method of a semiconductor device, a rare gas is added to a semiconductor film formed on an insulating surface using an ion-doping method, and laser light is irradiated to the semiconductor film added with the rare gas under a rare-gas atmosphere. The semiconductor film added with the rare gas is applied with a magnetic field in the laser light irradiation. COPYRIGHT: (C)2004,JPO
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申请公布号 |
JP2004172610(A) |
申请公布日期 |
2004.06.17 |
申请号 |
JP20030375265 |
申请日期 |
2003.11.05 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
YAMAZAKI SHUNPEI;NAKAMURA OSAMU;SHOJI HIRONOBU |
分类号 |
H01L21/20;H01L21/265;H01L21/268;H01L21/336;H01L29/786;(IPC1-7):H01L21/20 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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