发明名称 ELECTROMAGNETIC WAVE REFLECTION PROPERTY MEASUREMENT METHOD AND APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To clearly specify a measurement face and easily measure an electromagnetic reflection property at wide range frequencies in various material face such as a building wall etc. causing a communication interference although a plurality of reflection faces exist. <P>SOLUTION: An electromagnetic reflection property measurement method applies spread spectrum modulation to a carrier, transmits the carrier, implements synchronization acquisition at a receiving point and specifies a reflection wave of the measurement face from location information of the measurement face. The synchronization acquisition can be implemented by serial search acquisition. An electromagnetic reflection property measurement apparatus comprises a transmitter 1 and a receiving measurement instrument 5. The transmitter 1 is provided with a carrier oscillation mechanism 2, a spread spectrum modulation mechanism 3 and a transmitting antenna 4. The receiving measurement instrument is provided with a receiving antenna 6, a synchronization acquisition mechanism 7, a reflection wave specification mechanism 9 and a reflection property calculation mechanism 10. The synchronization acquisition mechanism 7 can be a mechanism for implementing the serial search acquisition. An existing transceiver can be used and easily measures. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2004170206(A) 申请公布日期 2004.06.17
申请号 JP20020335448 申请日期 2002.11.19
申请人 UNIV NIHON 发明人 SAEGUSA KENJI
分类号 G01N22/00;H04B17/00 主分类号 G01N22/00
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