发明名称 Automated selection and placement of memory during design of an integrated circuit
摘要 A tool for designing integrated circuits that optimizes the placement and timing of memory blocks within the circuit. Given a manufactured slice that has a number of blocks already diffused and logically integrated, the memory generation tool herein automatically considers the available diffused memory and the gate array of the slices to configure and optimize them into a customer's requirements for memory. The memory generation tool has a memory manager, a memory resource database, a memory resource selector, and a memory composer. Together these all interact to generate memories from the available memories within the memory resource database. The memory composer actually generates the RTL logic shells for the memories, and outputs the memory designs in Verilog, VHDL, or other tool synthesis language. Once a memory is created, it is tested. Upon successful testing, the memory manager updates the memory resource database to indicate the successfully tested memory is no longer available as a resource for the generation of further memories. A design integrator may review the memory designs output and further integrate the memory, its timing, testing, etc. with other blocks and functions of the integrated circuit.
申请公布号 US2004117744(A1) 申请公布日期 2004.06.17
申请号 US20020318623 申请日期 2002.12.13
申请人 LSI LOGIC CORPORATION 发明人 NATION GEORGE WAYNE;DELP GARY SCOTT;REULAND PAUL GARY
分类号 G06F17/50;H01L21/82;H01L21/822;H01L27/04;H01L27/118;(IPC1-7):G06F17/50 主分类号 G06F17/50
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