发明名称 SUBSTRATE PROCESSING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a substrate processing apparatus which is capable of setting a reflow distance L at a desired value with high accuracy. SOLUTION: Gas introduced into a chamber 101 is blowed on a substrate 1 as it passes through openings 211 bored in a gas blow-off board 21 formed of a curved board that is convex or concave to the substrate 1. The gas is blowed on the substrate 1 uniformly through the gas blow-off board 21, so that the reflow distance L can be controlled with high accuracy through all the surface of the substrate 1. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004172641(A) 申请公布日期 2004.06.17
申请号 JP20040042545 申请日期 2004.02.19
申请人 NEC KAGOSHIMA LTD 发明人 KIDO SHUSAKU;IIO YOSHIHIDE;IKEDA MASAKI
分类号 H01L21/027;(IPC1-7):H01L21/027 主分类号 H01L21/027
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