发明名称 ALIGNMENT METHOD FOR MEASURING INTERFERENCE SHAPE, AND INSTRUMENT FOR MEASURING INTERFERENCE SHAPE USING THE SAME
摘要 PROBLEM TO BE SOLVED: To simplify alignment work in measurement of an interference shape, and to enhance precision for shape measurement. SOLUTION: In this alignment method for measuring the interference shape, a concave or convex spherical face shape is used as a tested objective face, and a shape is measured by interference having a reference spherical wave. Returning light from the tested objective face is branched into two, one optical path thereof is used as an optical path for alignment, and an alignment error of the tested objective face is judged based on luminous energy of transmission light by a pinhole located in a position serving as a light convergence point of the returning light on the one optical path, so as to regulate a position and a posture of the tested objective face. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004170303(A) 申请公布日期 2004.06.17
申请号 JP20020337886 申请日期 2002.11.21
申请人 RICOH CO LTD 发明人 TAKAI MASAAKI
分类号 G01B9/02;G01B11/00;G01B11/26;G01M11/00;(IPC1-7):G01B9/02 主分类号 G01B9/02
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