发明名称 FABRICATION METHOD OF ELECTROOPTIC DEVICE, ELECTROOPTIC DEVICE AND ELECTRONIC APPARATUS REMOVING MINUTE SCARS AND CRACKS AND INCREASING PANEL INTENSITY
摘要 PURPOSE: An electrooptic device is provided to perform an etching process while an entire outer surface, a girth of a substrate, and a cut surface are exposed when a protection layer is formed. CONSTITUTION: An etching process is performed in at least girth and on cut surfaces of the first substrate(10) and the second substrate(20), in order to remove scars from the first substrate(10) and the second substrate(20) while the first substrate(10) is contacted with the second substrate(20) by a sealing material(30). When the etching process is performed, at least a portion of exposed wiring surfaces of the first substrate(10) and the second substrate(20) is covered by a protection layer formed by avoiding at least the girth and the cut surfaces of the first and second substrates(10,20).
申请公布号 KR20040050862(A) 申请公布日期 2004.06.17
申请号 KR20030088828 申请日期 2003.12.09
申请人 SEIKO EPSON CORPORATION 发明人 MURAI HIDETOSHI;HANAKAWA MANABU
分类号 G02F1/13;(IPC1-7):G02F1/13 主分类号 G02F1/13
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