发明名称 Isolation structures for imposing stress patterns
摘要 A substrate under tension and/or compression improves performance of devices fabricated therein. Tension and/or compression can be imposed on a substrate through selection of appropriate STI fill material. The STI regions are formed in the substrate layer and impose forces on adjacent substrate areas. The substrate areas under compression or tension exhibit charge mobility characteristics different from those of a non-stressed substrate. By controllably varying these stresses within NFET and PFET devices formed on a substrate, improvements in IC performance are achieved.
申请公布号 US2004113174(A1) 申请公布日期 2004.06.17
申请号 US20020318600 申请日期 2002.12.12
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 CHIDAMBARRAO DURESETI;DOKUMACI OMER H.;DORIS BRUCE B.;MANDELMAN JACK A.
分类号 H01L21/76;H01L21/762;H01L21/8238;H01L29/80;H01L31/109;H01L31/112;(IPC1-7):H01L31/109 主分类号 H01L21/76
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