发明名称 SEMICONDUCTOR DEVICE WITH REDUCED DISHING AND METHOD OF MANUFACTURING THE SAME
摘要 PURPOSE: A semiconductor device and a method of manufacturing the same are provided to reduce dishing of an interlayer dielectric at a periphery of a mark region by using a dishing prevention pattern. CONSTITUTION: The first patterns(3a,3b) are formed on a semiconductor substrate(1) within a device region(A1). The second pattern(3c) is formed on the substrate within an alignment mark region(A2). The second pattern is used as a dishing prevention pattern. An interlayer dielectric(4) for enclosing the first and second patterns is deposited thereon. The interlayer dielectric on the first and second patterns is selectively etched by using a predetermined photoresist pattern. The photoresist pattern is removed therefrom. The first and second patterns are exposed by planarizing the interlayer dielectric using CMP(Chemical Mechanical Polishing).
申请公布号 KR20040050873(A) 申请公布日期 2004.06.17
申请号 KR20030088915 申请日期 2003.12.09
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 SAITO TOMOHIRO
分类号 H01L21/027;H01L21/28;H01L21/304;H01L21/3105;H01L21/3205;H01L21/336;H01L21/8234;H01L23/52;H01L27/02;H01L27/088;H01L29/423;H01L29/49;H01L29/78;(IPC1-7):H01L21/304 主分类号 H01L21/027
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