发明名称 |
SEMICONDUCTOR DEVICE WITH REDUCED DISHING AND METHOD OF MANUFACTURING THE SAME |
摘要 |
PURPOSE: A semiconductor device and a method of manufacturing the same are provided to reduce dishing of an interlayer dielectric at a periphery of a mark region by using a dishing prevention pattern. CONSTITUTION: The first patterns(3a,3b) are formed on a semiconductor substrate(1) within a device region(A1). The second pattern(3c) is formed on the substrate within an alignment mark region(A2). The second pattern is used as a dishing prevention pattern. An interlayer dielectric(4) for enclosing the first and second patterns is deposited thereon. The interlayer dielectric on the first and second patterns is selectively etched by using a predetermined photoresist pattern. The photoresist pattern is removed therefrom. The first and second patterns are exposed by planarizing the interlayer dielectric using CMP(Chemical Mechanical Polishing).
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申请公布号 |
KR20040050873(A) |
申请公布日期 |
2004.06.17 |
申请号 |
KR20030088915 |
申请日期 |
2003.12.09 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
SAITO TOMOHIRO |
分类号 |
H01L21/027;H01L21/28;H01L21/304;H01L21/3105;H01L21/3205;H01L21/336;H01L21/8234;H01L23/52;H01L27/02;H01L27/088;H01L29/423;H01L29/49;H01L29/78;(IPC1-7):H01L21/304 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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