发明名称 Sulfide encapsulation passivation technique
摘要 A method for passivating a III-V material Schottky layer of a field effect transistor. The transistor has a gate electrode in Schottky contact with a gate electrode contact region of the Schottky layer. The gate electrode is adapted to control a flow of carriers between a source electrode of the transistor and a drain electrode of such transistor. The transistor has exposed surface portions of the Schottky layer beween the source electrode and the drain electrode adjacent to the gate electrode contact region of the Schottky layer. The method includes removing organic contamination from the exposed surface portions of the Schottky layer using a oxygen plasma. The contamination removed surface portions of the Schottky layer are exposed to a solution of ammonium sulfide and NH4OH. After removal of the solution, the exposed regions are dried in a nitrogen enviroment. A layer of passivating material is deposited over the dried surface portions.
申请公布号 US2004115908(A1) 申请公布日期 2004.06.17
申请号 US20020321310 申请日期 2002.12.17
申请人 MARSH PHILBERT FRANCIS;WHELAN COLIN S. 发明人 MARSH PHILBERT FRANCIS;WHELAN COLIN S.
分类号 H01L21/00;H01L21/02;H01L21/28;H01L21/314;H01L21/3213;H01L21/335;H01L21/44;(IPC1-7):H01L21/00 主分类号 H01L21/00
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