发明名称 |
Push button mode automatic pattern switching for interconnect built-in self test |
摘要 |
A built-in self test (BIST) unit, of a primary integrated circuit (IC) component of a computer system, is programmed or hardwired with a test pattern. The test pattern is launched in multiple test cycles, to test an interconnect bus of the computer system or perform a device validation test of the component. A pin assignment of the pattern is automatically changed after each test cycle, without requiring re-programming of the BIST unit to do so.
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申请公布号 |
US2004117707(A1) |
申请公布日期 |
2004.06.17 |
申请号 |
US20030404405 |
申请日期 |
2003.03.31 |
申请人 |
ELLIS DAVID G.;QUERBACH BRUCE;NEJEDLO JAY J.;KHAN AMJAD;BABCOCK SEAN R.;GAYLES ERIC S.;GOLLAPUDI ESHWAR |
发明人 |
ELLIS DAVID G.;QUERBACH BRUCE;NEJEDLO JAY J.;KHAN AMJAD;BABCOCK SEAN R.;GAYLES ERIC S.;GOLLAPUDI ESHWAR |
分类号 |
G01R31/28;G01R31/3185;G01R31/3187;G06F11/27;(IPC1-7):G11C5/06 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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