| 摘要 |
PROBLEM TO BE SOLVED: To improve a method of determining a defect in an OLED device. SOLUTION: The method of the determining a defect in the OLED device having a plurality of pixels each having its own emissive layer, which are capable of being excited by input light to produce an output color light response, comprises processes of: (a) illuminating one or more OLED devices or a portion of the OLED device with light in a predetermined portion of a spectrum so that the pixel emissive layer is excited to produce an output color response for each pixel; (b) capturing an image of the output light generated by the excited pixels and converting such captured light into a digital image; and (c) determining a device pixel size, shape, location, and emitted light intensity from the digital image and comparing the size, shape, location, and emitted light intensity with a predetermined acceptable size, shape, location, and emitted light intensity ranges to decide whether there is a defect in the OLED device. COPYRIGHT: (C)2004,JPO
|
