发明名称 Method of filling a via or recess in a semiconductor substrate
摘要 This invention relates to a method of filling a via or recess in a semiconductor substrate including: (i) depositing or forming a sacrificial layer on a functional dielectric layer, (ii) etching a via or recess through the sacrificial and functional layers; (iii) depositing metal onto the substrate by: (iv) lifting off or ablating the metal deposited on the surface of the sacrificial layers; (v) repeating steps (iii) and (iv) until the vias or recesses are at least full of metal; and (vi) removing any remaining sacrificial layer and any excess metal.
申请公布号 US2004115923(A1) 申请公布日期 2004.06.17
申请号 US20030471995 申请日期 2003.09.16
申请人 MACNEIL JOHN 发明人 MACNEIL JOHN
分类号 H01L21/027;H01L21/768;(IPC1-7):H01L21/476;H01L21/44 主分类号 H01L21/027
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