发明名称 |
Measuring degree of reflection of surfaces involves measuring radiation densities above target, reference surfaces, converting to electrical values, digitizing, forming target/reference signal ratio |
摘要 |
The method involves measuring the radiation densities above target (1) and reference (2) surfaces, converting to electrical values and digitizing, then deriving the relative degree of reflection from the ratio of the target and reference signals using a channel-dependent radiometric calibration coefficient. The temperatures (T1,T2) of the target and reference surfaces are measured and taken into account.
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申请公布号 |
DE10255023(A1) |
申请公布日期 |
2004.06.17 |
申请号 |
DE20021055023 |
申请日期 |
2002.11.25 |
申请人 |
DEUTSCHES ZENTRUM FUER LUFT- UND RAUMFAHRT E.V. |
发明人 |
RICHTER, RUDOLF;MUELLER, ANDREAS |
分类号 |
G01N21/47;(IPC1-7):G01J3/28 |
主分类号 |
G01N21/47 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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