发明名称 Technik für Einzelfehlerkorrektur im Cachespeicher mit Subblock-Paritätenbits
摘要 A data block includes a plurality of sub-blocks. Each sub-block includes a sub-block check bit that may be used to detect the presence of a bit error within the sub-block. A composite sub-block is generated, which is the column-wise exclusive-or of the bits of each sub-block. In one embodiment, the composite sub-block is not stored, but rather used for computational purposes only. A plurality of composite check bits is used to detect a bit position of a bit error within the composite sub-block. If a bit error within the data block occurs, the sub-block check bits may be used to detect in which sub-block the error occurred. The composite check bits may be used to determine which bit position of the composite sub-block is erroneous. The erroneous bit position of the composite sub-block also identifies the bit position of the erroneous bit in the sub-block identified by the sub-block check bits. Accordingly, the sub-block and the bit position within the sub-block may be detected by using the sub-block check bits and the composite check bits. <IMAGE>
申请公布号 DE69910320(T2) 申请公布日期 2004.06.17
申请号 DE1999610320T 申请日期 1999.09.22
申请人 SUN MICROSYSTEMS, INC. 发明人 CYPHER, ROBERT
分类号 G06F11/10;G06F12/10;G06F12/16;(IPC1-7):G06F11/10 主分类号 G06F11/10
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