发明名称 TEST PATTERN GENERATION METHOD FOR TESTING COLOR, PIXEL AND OPERATION OF DISPLAY
摘要 PURPOSE: A test pattern generation method for testing the color, pixel and operation of a display is provided to generate various test patterns for testing the display without external input. CONSTITUTION: It is judged whether a circuit is operated in a test mode(10). If the circuit is operated in the test mode, it is judged whether horizontal scanning is completed(20). If the horizontal scanning is not completed, it is judged whether all pixels of a horizontal block are displayed(30). If all the pixels of the horizontal block are displayed, next registers are indicated by index values(CSel,HSel)(40). A new color value is displayed(50). If all the pixels of the horizontal block are not displayed, a current color value is displayed(50). If the circuit is not operated in the test mode, values of all index registers are initialized(60). If the horizontal scanning is completed, it is judged whether vertical scanning is completed(70). If the vertical scanning is not completed, it is judged whether all vertical scanning lines are currently displayed(80). If all the vertical scanning lines are currently displayed, index values(VSel,CSel) are assigned as next values(90). The index value(HSel) is assigned as an initial value, and a next index value(CSel) is assigned to an index save unit(CselSave)(90). If all the vertical scanning lines are not currently displayed, a value of the index storing unit(CselSave) is assigned to the index value(CSel) and the initial value is assigned to the index value(HSel)(100).
申请公布号 KR20040050089(A) 申请公布日期 2004.06.16
申请号 KR20020077650 申请日期 2002.12.09
申请人 KOREA ELECTRONICS TECHNOLOGY INSTITUTE 发明人 BAN, MYEONG GI;CHO, GYEONG YEON
分类号 H04N17/02;(IPC1-7):H04N17/02 主分类号 H04N17/02
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