发明名称 Temperature correction method for thermal analysis apparatus and thermal analysis apparatus
摘要 Disclosed is a temperature correction method for a thermal analysis apparatus which measures electric current, voltage, and electric resistance of a measurement sample while changing the temperature of the measurement sample set between a pair of electrodes. The paired electrodes are connected by a reference substance, and a weight is set on the reference substance. The temperature at the time when the reference substance is fused and the weight falls cutting the reference substance is measure actually as a melting point by a temperature sensor. Based on a difference between the actually measured value and a literature value of the melting point of the reference substance, the temperature measured by the temperature sensor is corrected. is thus possible to correct precisely the results measured by the thermal analysis apparatus which deals with electric current, voltage, electric resistance, dielectric constant, electric capacity, thermal electromotive force, thermally stimulated current, and the like, as targets to be measured. <IMAGE>
申请公布号 EP1429129(A1) 申请公布日期 2004.06.16
申请号 EP20030257714 申请日期 2003.12.09
申请人 RIGAKU CORPORATION 发明人 MATSUO, SHUICHI
分类号 G01N25/20;G01K11/06;G01K19/00;G01N25/04 主分类号 G01N25/20
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