发明名称 Adjustment and calibration system for post-fabrication treatment of on-chip temperature sensor
摘要 An adjustment and calibration system for post-fabrication treatment of an on-chip temperature sensor is provided. As explained in detail below, the adjustment and calibration system includes at least one adjustment circuit, to which the on-chip temperature sensor is responsive, and a storage device that selectively stores control information (1) associated with a state of the adjustment circuit and/or (2) from a tester that writes such control information to the storage device, where the control information stored in the storage device is subsequently selectively read out in order to adjust the adjustment circuit to a state corresponding to the control information.
申请公布号 US6749335(B2) 申请公布日期 2004.06.15
申请号 US20020147937 申请日期 2002.05.17
申请人 SUN MICROSYSTEMS, INC. 发明人 GAUTHIER CLAUDE;AMICK BRIAN;GOLD SPENCER;TRIVEDI PRADEEP;OOI LYNN
分类号 G01K15/00;(IPC1-7):G01K15/00;G01K7/14;H01L35/00 主分类号 G01K15/00
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