发明名称 Systems and methods for electrically isolating portions of wafers
摘要 Systems for electrically isolating portions of wafers are provided. A representative system includes a first wafer and a first conductor formed at least partially through the first wafer. A first conductor insulating layer is formed at least partially through the first wafer. The first conductor insulating layer engages the first conductor and is disposed between the first conductor and material of the first wafer. A first outer insulating layer also is provided that is formed at least partially through the first wafer. The first outer insulating layer is spaced from the first conductor insulating layer. Both the first conductor insulating layer and the first outer insulating layer are formed of dielectric material. Methods also are provided.
申请公布号 US6750516(B2) 申请公布日期 2004.06.15
申请号 US20010035792 申请日期 2001.10.18
申请人 HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P. 发明人 HARTWELL PETER GEORGE
分类号 H01L23/52;H01L21/3205;H01L21/768;H01L23/48;H01L25/065;(IPC1-7):H01L29/76;H01L29/00 主分类号 H01L23/52
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