发明名称 SOI SUBSTRAT
摘要 A method of manufacturing a semiconductor substrate can effectively prevent a chipping phenomenon and the production of debris from occurring in part of the insulation layer and the semiconductor by removing a outer peripheral portion of the semiconductor substrate so as to make the outer peripheral extremity of the insulation layer to be located between the outer peripheral extremity of the semiconductor layer and that of the support member and hence the semiconductor layer and the insulation layer produce a stepped profile. <IMAGE>
申请公布号 AT268943(T) 申请公布日期 2004.06.15
申请号 AT19990300620T 申请日期 1999.01.28
申请人 CANON KABUSHIKI KAISHA 发明人 AKINO, YUTAKA;ATOJI, TADASHI
分类号 H01L21/20;H01L21/762;(IPC1-7):H01L21/20 主分类号 H01L21/20
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