发明名称 |
SEMICONDUCTOR DEVICE AND FABRICATING METHOD THEREOF |
摘要 |
PURPOSE: A semiconductor device is provided to form a metal interconnection with a smaller width by overcoming the limit of a conventional photolithographic apparatus using an oxide layer. CONSTITUTION: A substrate(100) is prepared. The first interlayer dielectric(102) having a contact part(C) is formed on the substrate. A plug(104) is formed in the contact part. The second interlayer dielectric(106) is formed on the substrate, having a trench(T) to expose the plug. An oxide wall(108) is formed on the side surface of the trench. The trench including the oxide wall is filled with a metal interconnection(110).
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申请公布号 |
KR20040049879(A) |
申请公布日期 |
2004.06.14 |
申请号 |
KR20020076833 |
申请日期 |
2002.12.05 |
申请人 |
ANAM SEMICONDUCTOR., LTD. |
发明人 |
KIM, JAE YEONG |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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