发明名称 |
NONVOLATILE MEMORY CELL AND NONVOLATILE SEMICONDUCTOR MEMORY DEVICE, IN WHICH ON STATE RESISTANCE OF SELECTION TRANSISTOR IS REDUCED |
摘要 |
PURPOSE: A nonvolatile memory cell and a nonvolatile semiconductor memory device are provided, which reduces ON state resistance of a selection transistor of a memory cell without increasing the whole area of a memory array and also realizes a stable operation by accelerating and stabilizing a read operation of data stored in the memory cell. CONSTITUTION: A memory cell(1) has two variable resistors(2) and a selection transistor(3) constituted with a N type MOS transistor selecting two variable resistors. One end of each variable resistor is connected to a drain electrode of the selection transistor. Another ends of the variable resistor are connected to other bit lines(BL). A gate of the selection transistor is connected to a word line(WL) and a source of the selection transistor is connected to a source line(SL).
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申请公布号 |
KR20040049288(A) |
申请公布日期 |
2004.06.11 |
申请号 |
KR20030087820 |
申请日期 |
2003.12.05 |
申请人 |
SHARP CORPORATION |
发明人 |
MORIKAWA YOSINAO |
分类号 |
G11C11/15;G11C11/16;G11C13/00;H01L21/8246;H01L27/10;H01L27/105;H01L27/24;H01L43/08;(IPC1-7):G11C11/15 |
主分类号 |
G11C11/15 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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