发明名称 NONVOLATILE MEMORY CELL AND NONVOLATILE SEMICONDUCTOR MEMORY DEVICE, IN WHICH ON STATE RESISTANCE OF SELECTION TRANSISTOR IS REDUCED
摘要 PURPOSE: A nonvolatile memory cell and a nonvolatile semiconductor memory device are provided, which reduces ON state resistance of a selection transistor of a memory cell without increasing the whole area of a memory array and also realizes a stable operation by accelerating and stabilizing a read operation of data stored in the memory cell. CONSTITUTION: A memory cell(1) has two variable resistors(2) and a selection transistor(3) constituted with a N type MOS transistor selecting two variable resistors. One end of each variable resistor is connected to a drain electrode of the selection transistor. Another ends of the variable resistor are connected to other bit lines(BL). A gate of the selection transistor is connected to a word line(WL) and a source of the selection transistor is connected to a source line(SL).
申请公布号 KR20040049288(A) 申请公布日期 2004.06.11
申请号 KR20030087820 申请日期 2003.12.05
申请人 SHARP CORPORATION 发明人 MORIKAWA YOSINAO
分类号 G11C11/15;G11C11/16;G11C13/00;H01L21/8246;H01L27/10;H01L27/105;H01L27/24;H01L43/08;(IPC1-7):G11C11/15 主分类号 G11C11/15
代理机构 代理人
主权项
地址