| 摘要 |
PROBLEM TO BE SOLVED: To provide an inspection method by which an observer can easily and precisely inspect a defect in a cholesteric liquid crystal layer by visual checks. SOLUTION: An inspection apparatus 10 is equipped with: an illumination light source 11 which projects illumination light L; a reflecting layer 14 which reflects illumination light L from the light source 11; and an absorption type linearly polarizing layer 12 disposed between the light source 11 and the reflection layer 14. The illumination light L from the light source 11 passes through the absorption type linearly polarizing layer 12 and a cholesteric liquid crystal layer 20, is then reflected on the reflecting layer 14 and passes again through the cholesteric liquid crystal layer 20 and the absorption type linearly polarizing layer 12. When the cholesteric liquid crystal layer 20 as the object has a defect, abnormality is generated in the polarization state of light at the spot where the defect is present on the plane of the cholesteric liquid crystal layer 20, and this generates difference in brightness (in-plane distribution) of the illumination light L emitted from the absorption type linearly polarizing layer 12. Thus, the defect in the cholesteric liquid crystal layer can be easily and precisely inspected by visual checks of an observer. COPYRIGHT: (C)2004,JPO
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