发明名称 |
Negative ion atmospheric pressure ionization and selected ion mass spectrometry using a 63Ni electron source |
摘要 |
Negative ion atmospheric pressure ionization mass spectrometers and selected ion mass spectrometers with a <63>Ni ion source and a drift tube for reaction of a sample with electrons from the <63>Ni ion source prior to analysis of a sample by mass spectrometry are provided. Also provided are methods for chemically analyzing a sample by negative ion atmospheric pressure ionization mass spectrometry by exposing the sample to electrons from a <63>Ni ion source in a drift tube and allowing the sample and electrons to react in the drift tube prior to analysis via mass spectrometry.
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申请公布号 |
US2004108454(A1) |
申请公布日期 |
2004.06.10 |
申请号 |
US20020264180 |
申请日期 |
2002.10.03 |
申请人 |
BANDY ALAN R. |
发明人 |
BANDY ALAN R. |
分类号 |
B01D59/44;H01J49/04;H01J49/06;(IPC1-7):H01J49/00 |
主分类号 |
B01D59/44 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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