发明名称 CHEMICAL MECHANICAL POLISHING APPARATUS
摘要 PURPOSE: A CMP(Chemical Mechanical Polishing) apparatus is provided to prevent the damage of a back film and the contamination of a polishing pad by uniformly forming the back film along a wafer including a flat zone. CONSTITUTION: A CMP apparatus is provided with a head, a back film(203) installed on the lower surface of the head for performing the buffering operation against the pressure of the head and supplying the suction for a wafer(207), and a polishing pad for polishing a polishing object layer of the wafer. At this time, the back film has a predetermined size for completely covering the wafer. Preferably, the back film has the same shape as the wafer.
申请公布号 KR20040048459(A) 申请公布日期 2004.06.10
申请号 KR20020076179 申请日期 2002.12.03
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, JAE HONG
分类号 H01L21/304;(IPC1-7):H01L21/304 主分类号 H01L21/304
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