发明名称 Method and system for lithography using phase-change material
摘要 Methods and systems are provided for forming an electrical interconnect layer between two layers of an integrated circuit. The interconnect layer is formed using a material having a first electrical conductivity corresponding to a first state and a second electrical conductivity corresponding to a second state, where the first electrical conductivity is different from the second electrical conductivity. An area of the material of the interconnect layer may be selected, for example, using a mask. Then energy may be applied to the selected area to change the electrical conductivity of the material in the selected area of the interconnect layer. Thus, the present invention may be used to implement optical memory devices which may be read by an electrical circuit.
申请公布号 US2004110094(A1) 申请公布日期 2004.06.10
申请号 US20020315003 申请日期 2002.12.10
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 CHEN YI-CHOU;LU CHIH-YUAN;LUNG HSIANG-LAN;CHUANG LI-HSIN
分类号 G03C5/00;H01L21/82;H01L27/24;H01L45/00;(IPC1-7):H01L21/82 主分类号 G03C5/00
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