发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a manufacturing method of a semiconductor device employing an STI (shallow trench isolation) method, which keeps high degree of flatness without causing dishing or erosion in an CMP (chemical mechanical polishing) process for forming an element isolation region. SOLUTION: The semiconductor device having a region isolated by the STI method on a semiconductor substrate comprises a device region for forming the semiconductor device, a dummy device region 13b, and an oxide film 4 for isolating the device region from the dummy device region 13b. The dummy device region 13b is provided with a cap layer 15 for preventing the dummy device region 13b from turning into silicide. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004165527(A) 申请公布日期 2004.06.10
申请号 JP20020331585 申请日期 2002.11.15
申请人 FUJITSU LTD 发明人 YOSHIMURA TETSUO;NANJO RYOTA
分类号 H01L21/28;H01L21/3205;H01L21/76;H01L21/8234;H01L23/52;H01L27/08;H01L27/088;(IPC1-7):H01L21/823;H01L21/320 主分类号 H01L21/28
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