发明名称 METHOD OF DRIVING TRANSISTOR
摘要 PROBLEM TO BE SOLVED: To make bias setting easily executable without being influenced by a variation in the manufacturing process of a MOSFET nor the fluctuation of a p-n junction temperature at the time of changing p-n junction between a body and a source of the MOSFET to a shallow forward bias, by applying a certain voltage to the back gate of the MOSFET for reducing 1/f noise generated in the MOSFET. SOLUTION: A diode which applies a bias voltage to the back gate of the MOSFET by which the 1/F noise is reduced is disposed adjacently to the MOSFET. The disposed diode uses junction which is equivalent to the p-n junction between the source and bulk of the MOSFET and the bias voltage is applied to the back gate of the MOSFET by using a voltage generated across the anode and cathode of the diode when the diode is driven by a constant current having a certain current value. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004165911(A) 申请公布日期 2004.06.10
申请号 JP20020328365 申请日期 2002.11.12
申请人 CANON INC 发明人 SAKURAGI KOSEI
分类号 H01L27/146;H01L21/822;H01L27/04;H03F3/08;H04N5/335;H04N5/357;H04N5/369;H04N5/374;H04N5/376;(IPC1-7):H03F3/08 主分类号 H01L27/146
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