发明名称 |
Method of increasing mechanical properties of semiconductor substrates |
摘要 |
Semiconductor wafers exhibiting increased mechanical strength and reduced susceptibility to fracture and methods of making the same are disclosed. The improved mechanical strength arises from a thin coating of a refractory material deposited on the backside of the wafer. Preferably, the coating is comprised of a ceramic. More preferably, the coating is comprised of silicon carbide. Also disclosed are methods for evaluating different coating materials.
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申请公布号 |
US2004110013(A1) |
申请公布日期 |
2004.06.10 |
申请号 |
US20030703803 |
申请日期 |
2003.11.07 |
申请人 |
YODER KARL J.;SUCHER BRADLEY D. |
发明人 |
YODER KARL J.;SUCHER BRADLEY D. |
分类号 |
H01L21/302;(IPC1-7):B32B9/04 |
主分类号 |
H01L21/302 |
代理机构 |
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主权项 |
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地址 |
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