发明名称 Method of increasing mechanical properties of semiconductor substrates
摘要 Semiconductor wafers exhibiting increased mechanical strength and reduced susceptibility to fracture and methods of making the same are disclosed. The improved mechanical strength arises from a thin coating of a refractory material deposited on the backside of the wafer. Preferably, the coating is comprised of a ceramic. More preferably, the coating is comprised of silicon carbide. Also disclosed are methods for evaluating different coating materials.
申请公布号 US2004110013(A1) 申请公布日期 2004.06.10
申请号 US20030703803 申请日期 2003.11.07
申请人 YODER KARL J.;SUCHER BRADLEY D. 发明人 YODER KARL J.;SUCHER BRADLEY D.
分类号 H01L21/302;(IPC1-7):B32B9/04 主分类号 H01L21/302
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