发明名称 METHOD FOR CLEANING SUBSTRATE PROCESSING CHAMBER
摘要 <p>A method for cleaning a substrate processing chamber which causes less damage to members in the substrate processing chamber is disclosed. The method for cleaning a processing chamber of an apparatus for processing a substrate comprises a gas supply step wherein a gas is supplied into a remote plasma generating unit provided to the substrate processing apparatus, a reacting species formation step wherein a reacting species is formed by exciting the gas in the remote plasma generating unit, and a reaction step wherein the reacting species is supplied into the processing chamber from the remote plasma generating unit while keeping the pressure within the processing chamber at 1333 Pa or higher.</p>
申请公布号 WO2004049421(A1) 申请公布日期 2004.06.10
申请号 WO2003JP14519 申请日期 2003.11.14
申请人 TOKYO ELECTRON LIMITED;YAMASAKI, HIDEAKI;NAKAMURA, KAZUHITO;MATSUZAWA, KOUMEI;MATSUDA, TSUKASA;KAWANO, YUMIKO 发明人 YAMASAKI, HIDEAKI;NAKAMURA, KAZUHITO;MATSUZAWA, KOUMEI;MATSUDA, TSUKASA;KAWANO, YUMIKO
分类号 C23C16/44;H01L21/205;H01L21/683;(IPC1-7):H01L21/31;H01L21/306 主分类号 C23C16/44
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