发明名称 |
SEMICONDUCTOR DEVICE HAVING FLOATING GATE ELECTRODE WITH SIDEWALL NITRIDE LAYER AND MANUFACTURING METHOD THEREOF |
摘要 |
PURPOSE: A semiconductor device and a manufacturing method thereof are provided to prevent the deformation of a floating gate electrode and to restrain the change of characteristics between devices by forming a nitride layer at both sidewalls of the floating gate electrode. CONSTITUTION: A floating gate electrode(103) is formed on a semiconductor substrate(101) via a tunnel insulating layer(102). A control gate electrode is formed on the floating gate electrode via an inter-electrode dielectric. The floating gate electrode is made of polycrystalline silicon. A nitride layer(108) is formed at both sidewalls of the floating gate electrode.
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申请公布号 |
KR20040048342(A) |
申请公布日期 |
2004.06.09 |
申请号 |
KR20030085679 |
申请日期 |
2003.11.28 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
OZAWA YOSHIO;HIEDA KATSUHIKO;KAWASAKI ATSUKO |
分类号 |
H01L21/316;H01L21/28;H01L21/336;H01L21/8247;H01L27/115;H01L29/423;H01L29/788;H01L29/792;(IPC1-7):H01L27/115 |
主分类号 |
H01L21/316 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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