发明名称 SEMICONDUCTOR DEVICE HAVING FLOATING GATE ELECTRODE WITH SIDEWALL NITRIDE LAYER AND MANUFACTURING METHOD THEREOF
摘要 PURPOSE: A semiconductor device and a manufacturing method thereof are provided to prevent the deformation of a floating gate electrode and to restrain the change of characteristics between devices by forming a nitride layer at both sidewalls of the floating gate electrode. CONSTITUTION: A floating gate electrode(103) is formed on a semiconductor substrate(101) via a tunnel insulating layer(102). A control gate electrode is formed on the floating gate electrode via an inter-electrode dielectric. The floating gate electrode is made of polycrystalline silicon. A nitride layer(108) is formed at both sidewalls of the floating gate electrode.
申请公布号 KR20040048342(A) 申请公布日期 2004.06.09
申请号 KR20030085679 申请日期 2003.11.28
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 OZAWA YOSHIO;HIEDA KATSUHIKO;KAWASAKI ATSUKO
分类号 H01L21/316;H01L21/28;H01L21/336;H01L21/8247;H01L27/115;H01L29/423;H01L29/788;H01L29/792;(IPC1-7):H01L27/115 主分类号 H01L21/316
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