| 摘要 |
To examine a diamond (3), the diamond (3) is irradiated with a broad, substantially monochromatic, slightly non-parallel X-ray beam (2), the diamond (3) is rotated on a spindle about an axis normal to the axis of the irradiating beam (2), and an annular detector (7) coaxial with the irradiating beam (2) is used to detect the number and/or spindle angular position of diffracted rays (9) emanating from the diamond (3) around a 180{ are coaxial with the irradiating beam (2). From the number of diffracted rays (9), one detects whether there is lattice misorientation and/or from the positions of the diffracted rays (9), one determines the orientation of the crystal lattice relative to the axis of rotation. |
