发明名称 BONDED SOI WAFER AND MANUFACTURING METHOD THEREOF
摘要 PURPOSE: A bonded SOI(Silicon On Insulator) wafer and a manufacturing method thereof are provided to restrain the generation of voids by forming a convexoconcave structure at an oxide layer of the SOI wafer. CONSTITUTION: A convexoconcave portion(13) is partially formed at an oxide layer(11), wherein the oxide layer is formed in an SOI wafer. Preferably, the width(W) of the convexoconcave portion is in the range of 10 μm to 1 mm. The surface area of the oxide layer bonded with a silicon wafer is in the range of 100 cm2, or less. Preferably, the convexoconcave portion is formed at a dicing object portion of the SOI wafer for manufacturing a semiconductor device at the post-process.
申请公布号 KR20040048216(A) 申请公布日期 2004.06.07
申请号 KR20020076005 申请日期 2002.12.02
申请人 SILTRON INC. 发明人 PARK, HYEONG GUK
分类号 H01L27/12;(IPC1-7):H01L27/12 主分类号 H01L27/12
代理机构 代理人
主权项
地址