发明名称 |
MOVING DISPLACEMENT MEASURING APPARATUS USED I/Q HETERODYNE INTERFEROMETER |
摘要 |
PURPOSE: A moving displacement measuring apparatus used an I/Q heterodyne interferometer is provided to measure an exact moving displacement when operating a stage in which a moving object is positioned at a high speed by simplifying a circuit for determining a position of the moving object and by continuously chasing a phase trace of the moving object. CONSTITUTION: A moving displacement measuring apparatus used I/Q heterodyne interferometer includes a first mode amplifier(200) and a second mode amplifier(210), a first mode comparator(220) and a second mode comparator(230), a moving period detecting part(240), and a moving displacement calculating part(250). The first mode amplifier(200) and the second mode amplifier(210) are used for amplifying a first moving detecting signal and a second moving detecting signal. The first mode comparator(220) and the second mode comparator(230) compare the first moving detecting signal and the second moving detecting signal with a reference voltage level so as to output a high level pulse signal or a low level pulse signal according to the result of the comparison.
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申请公布号 |
KR20040047210(A) |
申请公布日期 |
2004.06.05 |
申请号 |
KR20020075337 |
申请日期 |
2002.11.29 |
申请人 |
KOREA ELECTRONICS TECHNOLOGY INSTITUTE |
发明人 |
JUNG, JUNG GI;MUN, CHAN U;SUNG, HA GYEONG |
分类号 |
G01B11/14;(IPC1-7):G01B11/14 |
主分类号 |
G01B11/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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