发明名称 SEMICONDUCTOR MANUFACTURING EQUIPMENT HAVING SEMICONDUCTOR WAFER ID CHECK SYSTEM AND SEMICONDUCTOR WAFER TREATMENT METHOD USING THE SAME
摘要 PURPOSE: Semiconductor manufacturing equipment having a semiconductor wafer ID(IDentification) check system and a semiconductor wafer treatment method using the same are provided to be capable of automatically and exactly checking semiconductor wafers without the waste of manpower and time before a semiconductor wafer treatment process. CONSTITUTION: Semiconductor manufacturing equipment is provided with an elevator(100) for moving a carrier having a plurality of semiconductor wafers up and down, and a wafer ID check part(200) for checking the bar code of the carrier and the ID of the semiconductor wafer. The semiconductor manufacturing equipment further includes a flat zone alignment part(300) for carrying out a semiconductor wafer aligning process and a number checking process for the semiconductor wafers, a carrier-wafer separation part(400) for separating the semiconductor wafers from the carrier, and a bath(500) for carrying out a wafer treatment process on the semiconductor wafer.
申请公布号 KR20040046017(A) 申请公布日期 2004.06.05
申请号 KR20020073816 申请日期 2002.11.26
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI, UK JIN;KIM, TAE JUN;KO, SEUNG JAE;PARK, GI HWAN
分类号 H01L21/66;(IPC1-7):H01L21/66 主分类号 H01L21/66
代理机构 代理人
主权项
地址