发明名称 |
SEMICONDUCTOR MANUFACTURING EQUIPMENT HAVING SEMICONDUCTOR WAFER ID CHECK SYSTEM AND SEMICONDUCTOR WAFER TREATMENT METHOD USING THE SAME |
摘要 |
PURPOSE: Semiconductor manufacturing equipment having a semiconductor wafer ID(IDentification) check system and a semiconductor wafer treatment method using the same are provided to be capable of automatically and exactly checking semiconductor wafers without the waste of manpower and time before a semiconductor wafer treatment process. CONSTITUTION: Semiconductor manufacturing equipment is provided with an elevator(100) for moving a carrier having a plurality of semiconductor wafers up and down, and a wafer ID check part(200) for checking the bar code of the carrier and the ID of the semiconductor wafer. The semiconductor manufacturing equipment further includes a flat zone alignment part(300) for carrying out a semiconductor wafer aligning process and a number checking process for the semiconductor wafers, a carrier-wafer separation part(400) for separating the semiconductor wafers from the carrier, and a bath(500) for carrying out a wafer treatment process on the semiconductor wafer.
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申请公布号 |
KR20040046017(A) |
申请公布日期 |
2004.06.05 |
申请号 |
KR20020073816 |
申请日期 |
2002.11.26 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHOI, UK JIN;KIM, TAE JUN;KO, SEUNG JAE;PARK, GI HWAN |
分类号 |
H01L21/66;(IPC1-7):H01L21/66 |
主分类号 |
H01L21/66 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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