发明名称 |
METHOD FOR MANUFACTURING DEVICE HAVING REFLECTIVE MASK AND COMPUTER PROGRAM THEREOF |
摘要 |
PURPOSE: A device manufacturing method and a computer program thereof are provided to improve an imaging characteristic of the device by using a reflective mask and an inclined light source. CONSTITUTION: A substrate is provided. At least a portion of the substrate is covered with a radiation resistive layer. A projection beam(PB) of the radiation is provided by using a radiation system. A pattern is provided to a cross-section of the projection beam by using a reflective mask(MA) on which the pattern is formed by a thick radiation absorber. The patterned beam is projected on a target point(C) of the radiation resistive layer. A system aberration in the projection system is controlled to compensate for mask-induced imaging artifacts. the radiation absorber is thick relative to a wavelength of the patterned beam of radiation.
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申请公布号 |
KR20040047703(A) |
申请公布日期 |
2004.06.05 |
申请号 |
KR20030085198 |
申请日期 |
2003.11.27 |
申请人 |
ASML NETHERLANDS B.V. |
发明人 |
LOWISCH MARTIN;DIERICHS MARCEL MATHIJS THEODORE MARIE;VANINGENSCHENAU KOEN;VAN DER LAAN HANS;LEENDERS MARTINUS HENDRIKUS ANTONIUS;MCGOO ELAINE;MICKAN UWE |
分类号 |
G03F1/14;G03F1/24;G03F7/20;G03F7/22;G03F9/02;H01L21/027;(IPC1-7):H01L21/027 |
主分类号 |
G03F1/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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