发明名称 |
SEMICONDUCTOR DEVICE WITH REDUCED PERIPHERAL REGION AND MULTILAYER METAL LINE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
PURPOSE: A semiconductor device and a method of manufacturing the same are provided to improve the aperture ratio of a pixel region by using a reduced peripheral region and a multilayer metal line. CONSTITUTION: A semiconductor device includes a pixel region(101) and a plurality of peripheral regions(102a,102b,102c). At this time, the width of the peripheral region is half as much as that of a conventional peripheral region. The peripheral region includes a plurality of gate electrodes of TFTs(Thin Film Transistors) and a metal line. The metal line for contacting the gate electrodes is formed on or under the gate electrodes. The metal line is made of more than two layers. |
申请公布号 |
KR20040047720(A) |
申请公布日期 |
2004.06.05 |
申请号 |
KR20030085429 |
申请日期 |
2003.11.28 |
申请人 |
SEMICONDUCTOR ENERGY LABORATORY K.K.;SHARP CORPORATION |
发明人 |
ISHIKAWA AKIRA;FUKUSHIMA YASUMORI |
分类号 |
G02F1/1368;G02F1/1345;G02F1/1362;H01L21/3205;H01L21/768;H01L21/77;H01L21/84;H01L23/52;H01L27/12;H01L29/786;(IPC1-7):H01L29/786 |
主分类号 |
G02F1/1368 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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