发明名称 SEMICONDUCTOR DEVICE WITH REDUCED PERIPHERAL REGION AND MULTILAYER METAL LINE AND METHOD OF MANUFACTURING THE SAME
摘要 PURPOSE: A semiconductor device and a method of manufacturing the same are provided to improve the aperture ratio of a pixel region by using a reduced peripheral region and a multilayer metal line. CONSTITUTION: A semiconductor device includes a pixel region(101) and a plurality of peripheral regions(102a,102b,102c). At this time, the width of the peripheral region is half as much as that of a conventional peripheral region. The peripheral region includes a plurality of gate electrodes of TFTs(Thin Film Transistors) and a metal line. The metal line for contacting the gate electrodes is formed on or under the gate electrodes. The metal line is made of more than two layers.
申请公布号 KR20040047720(A) 申请公布日期 2004.06.05
申请号 KR20030085429 申请日期 2003.11.28
申请人 SEMICONDUCTOR ENERGY LABORATORY K.K.;SHARP CORPORATION 发明人 ISHIKAWA AKIRA;FUKUSHIMA YASUMORI
分类号 G02F1/1368;G02F1/1345;G02F1/1362;H01L21/3205;H01L21/768;H01L21/77;H01L21/84;H01L23/52;H01L27/12;H01L29/786;(IPC1-7):H01L29/786 主分类号 G02F1/1368
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