SYSTEM ON CHIP TEST CIRCUIT AND ITS TEST METHOD

摘要

PURPOSE: A system on chip(SoC) test circuit and its test method are provided to test an internal flip flop and a memory and an IP of a SoC with a data pattern inputted and being output directly. CONSTITUTION: According to the SoC test circuit to test an internal circuit(110) and a flip flop and a memory(200) and an IP of a SoC, an input data generation unit(120) inputs an output signal of the internal circuit or scan data input to the memory and the internal circuit according to a scan signal by receiving an output signal from the internal circuit and a scan signal and scan data from the external. And an output data generation part outputs a number of output data by selecting an output of the memory and an output of the IP and an output of the input data generation unit respectively according to a strobe input and the first and the second selection input.