发明名称 ELECTRON MICROSCOPE, METHOD OF DISPLAYING OBSERVED IMAGE OF ELECTRON MICROSCOPE, PROGRAM FOR DISPLAYING THE SAME, AND RECORDING MEDIUM READABLE BY COMPUTER
摘要 PROBLEM TO BE SOLVED: To provide an electron microscope whereby a region producing over range can be intelligibly recognized, and a gain, a contrast and the like can be easily adjusted. SOLUTION: This electron microscope is provided with an over range extraction setting means to display over range regions P. Y corresponding to over ranges in gradation expression and other regions in an observed image imaged by the electron microscope, by different modes. The over range extraction setting means converts the over region P of the observed image having a larger gradation value than a first prescribed value and the under region Y of the observed image having smaller gradation value than a second prescribed value to different color tones by image processing to display them in the over range region. Thereby, an operator of the electron microscope can recognize each over range region based on a converted color. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004158367(A) 申请公布日期 2004.06.03
申请号 JP20020324900 申请日期 2002.11.08
申请人 KEYENCE CORP 发明人 TACHIBANA KAZUHIRO
分类号 H01J37/22;(IPC1-7):H01J37/22 主分类号 H01J37/22
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