发明名称 APPARATUS AND METHOD FOR CUTTING OFF ELEMENT FROM SUBSTRATE
摘要 <P>PROBLEM TO BE SOLVED: To provide a method for holding a substrate to the placing surface for substantially perfectly cutting off the substrate, for separating the substrate along the cutting pattern into dies, and for holding the cut dies to the placing surface during and after the cutting process. <P>SOLUTION: In a process and system for cutting off a wafer 14 including a semiconductor substrate provided with an array of integrated elements, the apparatus has a porous placing surface and includes a vacuum chuck for holding the wafer by vacuum. The wafer 14 is cut off by irradiating the substrate by pulsed laser of an ultraviolet laser using a solid state laser 10 having controlled polarization. The separated dies are adhered with adhesive film to be removed from the placing surface. Alternatively, the separated dies are removed from the wafer 14 by another way after being cut. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2004158859(A) 申请公布日期 2004.06.03
申请号 JP20030373955 申请日期 2003.11.04
申请人 NEW WAVE RESEARCH 发明人 LIU KUO-CHING
分类号 B23Q3/08;B23K26/00;B23K26/10;B23K26/40;B28D5/00;H01L21/00;H01L21/301;H01L21/304;H01L21/67;H01L21/68;H01L21/683;H01L33/32;H01S5/00 主分类号 B23Q3/08
代理机构 代理人
主权项
地址