发明名称 Method of manufacturing a flash memory cell
摘要 The present invention relates to a method of manufacturing a flash memory cell. A tunnel oxide film is formed before a trench is formed and an exposed portion is then etched by a given thickness. Therefore, a phenomenon that the corner of the trench is thinly formed by a sidewall oxidization process is prevented and an active region of a desired critical dimension can be secured.
申请公布号 US2004106256(A1) 申请公布日期 2004.06.03
申请号 US20030706932 申请日期 2003.11.14
申请人 HYNIX SEMICONDUCTOR INC. 发明人 DONG CHA DEOK;KWAK NOH YEAL
分类号 H01L21/76;H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L21/336 主分类号 H01L21/76
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