| 摘要 |
PROBLEM TO BE SOLVED: To provide a calibration method for a semiconductor tester capable of reducing costs, simplifying working contents, and shortening working hours. SOLUTION: The phase of a strobe signal corresponding to each of a plurality of comparators is adjusted on the basis of the clock signal of one driver, and the phase of the clock signal corresponding to each of a plurality of drivers corresponding to each of the plurality of comparators is adjusted on the basis of each of a plurality of strobe signals whose phase is adjusted. COPYRIGHT: (C)2004,JPO
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