PHOTONIC DEVICES AND PICS INCLUDING SACRIFICIAL TESTING STRUCTURES AND METHOD OF MAKING THE SAME

摘要

A testing structure formed on a photonic integrated circuit including a plurality of first photonic components and having a given functionality corresponding to a given interconnectivity of the first photonic components, the testing structure including: at least one second photonic component being suitable for testing at least one of the first photonic components; and, at least one photonic pathway optically coupling the at least one first photonic component to the at least one second photonic component. The at least one photonic pathway is unique from the given interconnectivity.